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4 edition of 14th IEEE VLSI Test Symposium found in the catalog.

14th IEEE VLSI Test Symposium

April 28-May 1, 1996, Princeton, New Jersey

by IEEE VLSI Test Symposium (14th 1996 Princeton, N.J.)

  • 392 Want to read
  • 35 Currently reading

Published by IEEE Computer Society Press in Los Alamitos, Calif .
Written in English

    Subjects:
  • Integrated circuits -- Very large scale integration -- Testing -- Congresses.

  • Edition Notes

    Other titlesProceedings, Fourteenth IEEE VLSI Test Symposium
    Statementsponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
    ContributionsIEEE Computer Society. Test Technology Technical Committee., Institute of Electrical and Electronics Engineers. Philadelphia Section.
    Classifications
    LC ClassificationsTK7874 .I26 1996
    The Physical Object
    Paginationxxix, 510 p. :
    Number of Pages510
    ID Numbers
    Open LibraryOL20347277M
    ISBN 100818673044, 0818673060

    Chetan D. Parikh and Amara Amara, “A MHz rail-to-rail amplifier with double-gate MOSFETs,” in Proceedings of 15th IEEE VLSI Design and Test Symposium, VDAT , Pune, July, Bhavi M. Panchal and Chetan D. Parikh, “A V Piecewise-Linear Curvature-Corrected CMOS Bandgap Reference,” in Proceedings of National Conference on. VLSI Test Symposium (VTS'13), IEEE 31st, vol., no., pp, Berkly, CA April-May Conference paper AR: TBD Download Framework for dynamic estimation of .

    Selected Research Papers: Atif Yasin, Tiankai Su, Sebastien Pillement, Maciej Ciesielski, Hardware-based Implicit Rewriting for Square-root Verification, Design, Automation and Test in Europe Conference, DATE, March Atif Yasin, Tiankai Su, Sebastien Pillement, Maciej Ciesielski, Functional Verification of Hardware Dividers using Algebraic Model, IFIP/IEEE 27th. Xin Li’s profile, publications, research topics, and co-authors. Prof. Xin Li received the Ph.D. degree in Electrical and Computer Engineering from Carnegie Mellon University, Pittsburgh, Pennsylvania, in , and the M.S. and B.S. degrees in Electronics Engineering from Fudan University, Shanghai, China, in and , respectively.

    IEEE VLSI Test Symposium (VTS) ( – ) IEEE Design Automation and Test in Europe (DATE) Conference ( – ) IEEE International symposium on Defect and fault Tolerance in VLSI Systems (DFT) () IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) (). 14th VLSI Design and Test Symposium VDAT Attended 14th VLSI Design and Test Symposium VDAT Chitkara University, Himachal Pradesh, 7th -9th July, Workshop at IIT Delhi: Workshop on “MEMS Design using IntelliSuite and COMSOL” at IIT Delhi during 7th- .


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14th IEEE VLSI Test Symposium by IEEE VLSI Test Symposium (14th 1996 Princeton, N.J.) Download PDF EPUB FB2

Get this from a library. 14th IEEE VLSI Test Symposium: April May 1,Princeton, New Jersey: proceedings. [IEEE Computer Society. Test Technology Technical Committee.; Institution of Electrical and Electronics Incorporated Engineers. Philadelphia Section.;].

Vlsi Test Symposium (Vts ): 19th IEEE Symposium [International Conference on VLSI Design (14th: Bangalore, India)] on *FREE* shipping on qualifying offers. Vlsi Test Symposium (Vts ): 19th IEEE Symposium. Get this from a library. VLSI Test Symposium, 14th IEEE (VTS '96). -- Reports on recent concepts, methodologies, and trends in testing electronic circuits and systems to meet the challenges of a wider range of capabilities being integrated into compact products, and.

Praveen Kumar Reddy, RajendraPatrikar,”A Novel Curvature Compensation Technique for voltage reference circuit”, 14th IEEE VLSI Design & Test (VDAT) Symposium, July Anita Deshmukh, Ravi Patil, RaghvendraDeshmukh, RajendraPatrikar,”Asynchronous ADC Using Novel Asynchronous Subranging Scheme”,14th IEEE VLSI Design & Test (VDAT.

Dufaza C and Ihs H Test Synthesis for DC Test and Maximal Diagnosis of Switched-Capacitor Circuits Proceedings of the 15th IEEE VLSI Test Symposium Dufaza C and Zorian Y On the Generation of Pseudo-Deterministic Two-Patterns Test Sequence with LFSRs Proceedings of the European conference on Design and Test.

handling X-states from over-clocked delay tests,º in Proc. 28th IEEE VLSI Test Symposium,pp. 57± [87] R. Garg, R. Putman, and N. Touba, ªIncreasing output compaction in presence of unknowns using an X-canceling MISR with deterministic observation,º in Proc.

26th IEEE VLSI Test Symp.,pp. 35±!. He co-authored and co-edited the latest VLSI test textbook (VLSI Test Principles and Architectures: Design for Testability) in and the first comprehensive book on power-aware VLSI testing (Power-Aware Testing and Test Strategies for Low Power Devices) in His research interests include design, test, and diagnosis of VLSI circuits.

Kohari, and M. Rencz, “CMOS Sensors for On-line Thermal Monitoring of VLSI Circuits,” In IEEE Transactions on Very Large Scale Integration (VLSI) Systems. Portillo, E. John and S. Narasimhan, “Building Trust in 3PIP using Asset-based Security Property Verification” IEEE VLSI Test SymposiumLas Vegas, NV, AprilS.

Koppa, M. Mohandesi and E. John “An Ultra-Low Power CR-SAR A/D Converter for Biomedical Applications”, Journal of Low Power Electronics, Vol, No. 4., pp. The International Symposium on Mixed and Augmented Reality (ISMAR) is the leading international academic conference in the field of augmented reality and mixed symposium is organized and supported by IEEE Computer Society and IEEE first ISMAR conference was held in in Darmstadt, Germany.

The creation of the conference emerged from the fusion of two former academic. In: Proc. 14th IEEE Asian Test Symposium, pp. – (December ) Google Scholar Udavanshi, S.: Design of Low Power and High Fault Coverage Test Pattern Generator for BIST.

Book Chapters. Shreyas Sen in IEEE VLSI Test Symposium (VTS )"Built-In Test Driven Power Aware Self Tuning of Wideband RF Devices," in 14th IEEE European Test Symposium (ETS ).

C Jayaram Natarajan, Gokul Kumar, Shreyas Sen, Muhammad M. Nisar, Deuk Lee and. IEEE East-West Design & Test Symposium (EWDTS) Publications: conference_item IEEE 21st International On-Line Testing Symposium (IOLTS) Publications: conference_itemaff Publications: conference_item 14th IEEE International Conference on Electronics, Circuits and Systems (ICECS) Publications: conference_item.

from book Progress in VLSI Design and Test - 16th International Symposium, VDATShibpur, India, JulyProceedings (pp) Power problems in VLSI circuit testing.

Book Chapter. VLSI-SoC: Research Trends in VLSI and Systems on Chip (Tsuyoshi Iwagaki, Satoshi Ohtake and Hideo Fujiwara, "Broadside transition test generation for partial scan circuits through stuck-at test generation," pp), Edited by Giovanni De Micheli, Salvador Mir.

Lee and I. Hajj, "Test generation for current testing of bridging faults in CMOS VLSI circuits," Proceedings of IEEE 38th Midwest Symposium on Circuits and Systems, Rio de Janeiro, Brazil, Augustpp. The IEEE Annual Symposium on Foundations of Computer Science (FOCS) is an academic conference in the field of theoretical computer is sponsored by the IEEE Computer Society.

As Fich () writes, FOCS and its annual Association for Computing Machinery counterpart STOC (the Symposium on Theory of Computing) are considered the two top conferences in theoretical computer. Mrugalski G, Mukherjee N, Rajski J and Tyszer J Planar High Performance Ring Generators Proceedings of the 22nd IEEE VLSI Test Symposium Brent R, Larvala S and Zimmermann P () A fast algorithm for testing reducibility of trinomials mod 2 and some new primitive trinomials of degreeMathematics of Computation,( R.

Rad and M. Tehranipoor, "SCT: An Approach for Testing and Configuring Nanoscale Devices," in Proc. IEEE VLSI Test Symposium (VTS'06), J. Lee, M. Tehranipoorand J. Plusquellic, "A Low-Cost Solution for Protecting IPs Against Side-Channel Scan-Based Attacks," In Proc.

IEEE VLSI Test Symposium (VTS'06), Proc. IEEE 37th VLSI Test Symposium (VTS), Monterey, CA, Aprilalgorithms are designed to produce test vectors using circuit’s timing information. Z.-H. Yang and T.-Y. Ho, "Timing-Aware Clock Gating of Pulsed-Latch Circuits for Low Power Design," Proceedings of IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT), pp.Hsinchu, Taiwan, April 3.

Sudha vani Yamani, Usha Rani Nelakuditi and Ramesh Vaddi, Low Write Energy STT-MRAM Cell using 2T- Hybrid Tunnel FETs exploiting the Steep slope and Ambipolar characteristics, 21st IEEE/VSI sponsored VLSI Design and Test Symposium (VDAT), IIT Roorkee, India, 29th June- 2nd July, ().

4.ACM/IEEE 14th International Conference on Information Processing in Sensor Networks (IPSN), Seattle, April Book Chapter AR: TBD% Download. IEEE VLSI Test Symposium (VTS),Napa Valley, California Conference Paper AR: 30% Download.